特性

JEDEC JESD204B Support

Ultra-Low RMS Jitter and Performance

    88 fs RMS jitter (12 kHz to 20 MHz)

    91 fs RMS jitter (100 Hz to 20 MHz)

    –162.5 dBc/Hz noise floor at 245.76 MHz

Up to 14 Differential Device Clocks from PLL2

    Up to 7 SYSREF Clocks

    Maximum clock output frequency 3.1 GHz

    LVPECL, LVDS, HSDS, LCPECL programmable

    outputs from PLL2

Up to 1 buffered VCXO/Crystal output from PLL1

    LVPECL, LVDS, 2xLVCMOS programmable

Dual Loop PLLatinum PLL Architecture

PLL1

    Up to 3 redundant input clocks

    Automatic and manual switch-over modes

    Hitless switching and LOS

    Integrated Low-Noise Crystal Oscillator

    Circuit

    Holdover mode when input clocks are lost

PLL2

    Normalized [1 Hz] PLL noise floor of

    –227 dBc/Hz

    Phase detector rate up to 155 MHz

    OSCin frequency-doubler

    Two Integrated Low-Noise VCOs

50% duty cycle output divides, 1 to 32

(even and odd)

Precision digital delay, dynamically adjustable

25 ps step analog delay

Multi-mode: Dual PLL, single PLL, and clock

distribution in 0 delay option

Industrial Temperature Range: –40 to 85°C

3.15 V to 3.45 V operation

Package: 64-pin QFN (9.0 × 9.0 × 0.8 mm)

描述

The LMK04820 family is the industry’s highest performance clock conditioner with JEDEC JESD204B support.

The 14 clock outputs from PLL2 can be configured to drive seven JESD204B converters or other logic devices using device and SYSREF clocks. SYSREF can be provided using both DC and AC coupling. Not limited to JESD204B applications, each of the 14 outputs can individually be configured as a high performance outputs for traditional clocking systems.

The high performance combined with features like the ability to trade off between power or performance, dual VCOs, dynamic digital delay, holdover, glitchless analog delay make the LMK04820 family ideal for providing flexible high performance clocking trees.

应用

Wireless Infrastructure

Data Converter Clocking

Networking, SONET/SDH, DSLAM

Medical / Video / Military / Aerospace

Test and Measurement