FSYC264D3 Datasheet

  • FSYC264D3

  • Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs

  • 52.03KB

  • 8页

  • INTERSIL   INTERSIL

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FSYC264D,
FSYC264R
July 1998
Radiation Hardened, SEGR Resistant
N-Channel Power MOSFETs
Description
The Discrete Products Operation of Intersil has developed a
series of Radiation Hardened MOSFETs speci铿乧ally
designed for commercial and military space applications.
Enhanced Power MOSFET immunity to Single Event Effects
(SEE), Single Event Gate Rupture (SEGR) in particular, is
combined with 100K RADS of total dose hardness to provide
devices which are ideally suited to harsh space environ-
ments. The dose rate and neutron tolerance necessary for
military applications have not been sacri铿乧ed.
The Intersil portfolio of SEGR resistant radiation hardened
MOSFETs includes N-Channel and P-Channel devices in a
variety of voltage, current and on-resistance ratings.
Numerous packaging options are also available.
This MOSFET is an enhancement-mode silicon-gate power
铿乪ld-effect transistor of the vertical DMOS (VDMOS) struc-
ture. It is specially designed and processed to be radiation
tolerant. The MOSFET is well suited for applications
exposed to radiation environments such as switching regula-
tion, switching converters, motor drives, relay drivers and
drivers for high-power bipolar switching transistors requiring
high speed and low gate drive power. This type can be
operated directly from integrated circuits.
Reliability screening is available as either commercial, TXV
equivalent of MIL-S-19500, or Space equivalent of
MIL-S-19500. Contact Intersil for any desired deviations
from the data sheet.
Features
鈥?34A, 250V, r
DS(ON)
= 0.080鈩?/div>
鈥?Total Dose
- Meets Pre-RAD Speci铿乧ations to 100K RAD (Si)
鈥?Single Event
- Safe Operating Area Curve for Single Event Effects
- SEE Immunity for LET of 36MeV/mg/cm
2
with
V
DS
up to 80% of Rated Breakdown and
V
GS
of 10V Off-Bias
鈥?Dose Rate
- Typically Survives 3E9 RAD (Si)/s at 80% BV
DSS
- Typically Survives 2E12 if Current Limited to I
DM
鈥?Photo Current
- 21nA Per-RAD(Si)/s Typically
鈥?Neutron
- Maintain Pre-RAD Speci铿乧ations
for 1E13 Neutrons/cm
2
- Usable to 1E14 Neutrons/cm
2
Ordering Information
RAD LEVEL
10K
10K
100K
100K
100K
SCREENING LEVEL
Commercial
TXV
Commercial
TXV
Space
PART NUMBER/BRAND
FSYC264D1
FSYC264D3
FSYC264R1
FSYC264R3
FSYC264R4
Symbol
D
G
Formerly available as type TA17668.
S
Package
SMD-2
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
http://www.intersil.com or 407-727-9207
|
Copyright
Intersil Corporation 1999
File Number
4548
1

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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
    INTERSIL
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant, N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant, N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant, N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant, N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
    INTERSIL
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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  • 英文版
    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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  • 英文版
    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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    Radiation Hardened, SEGR Resistant N-Channel Power MOSFETs
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