temperature, voltage and frequency. This change with time
is known as aging. Aging is caused by a gradual re-align-
in dissipation factor versus time. A typical curve of aging
table is given showing the aging rates of various dielectrics.
鈦?/div>
2
hour will suffice) the part will
de-age and return to its initial capacitance and dissipation
factor readings. Because the capacitance changes rapidly,
immediately after de-aging, the basic capacitance
measurements are normally referred to a time period some-
time after the de-aging process. Various manufacturers use
different time bases but the most popular one is one day or
twenty-four hours after 鈥渓ast heat.鈥?Change in the aging
curve can be caused by the application of voltage and
other stresses. The possible changes in capacitance due to
de-aging by heating the unit explain why capacitance
changes are allowed after test, such as temperature
cycling, moisture resistance, etc., in MIL specs. The
application of high voltages such as dielectric withstanding
voltages also tends to de-age capacitors and is why
re-reading of capacitance after 12 or 24 hours is allowed in
military specifications after dielectric strength tests have
been performed.
Figure 4
Typical Cap. Change vs. Temperature
AVX X7R T.C.
Capacitance Change Percent
+20
+10
0VDC
0
-10
-20
-30
-55 -35
-15
+5
+25 +45 +65 +85 +105 +125
RVDC
Temperature Degrees Centigrade
Figure 5
Cap. Change vs. Frequency
Capacitance Change Percent
AVX C0G (NP0) T.C.
0
AVX X7R T.C.
-10
-20
-30
1
KHz
10
KHz
100
KHz
1
MHz
10
MHz
100
MHz
1
GHz
Frequency
Figure 6
6