半导体器件并联系统可靠性评估的经验Bayes方法

师小琳¹，段哲民¹，师义民²

（1. 西北工业大学电子工程系，陕西西安 710072；2. 西北工业大学应用数学系，陕西 西安 710072）

摘要:为了提高机载开关电源中半导体器件并联系统可靠性评估的准确性，运用经验Bayes法和经典的统计方法，研究了该系统的可靠性评估问题。分别给出了系统可靠性指标的经验Bayes估计，极大似然估计。利用Monte-Carlo方法，对两种估计结果进行了比较，结果表明，经验Bayes估计的误差为0.07，它小于极大似然估计的误差0.368。

关键词:半导体器件并联系统；可靠性评估；经验Bayes方法

中图分类号: O213.2 文献标识码:A 文章编号:1001-2028（2004）07-0048-03

Empirical Bayes Method of Reliability Evaluation for

Semiconductor Parallel System

SHI Xiao-lin¹, DUAN Zhe-min¹, SHI Yi-min²

(1. Department of Electronic Engineering, Northwestern Polytechnical University, Xi’an 710072, China; 2. Department of Applied Mathematics, Northwestern Polytechnical University, Xi’an, 710072, China)

Abstract: In order to improve the accuracy of the reliability evaluation for semiconductor parallel system, evaluated are the reliability for this system by using empirical Bayes and classical statistical methods. Empirical Bayes estimation (EBE) and maximum likelihood estimation (MLE) of reliability index are given, respectively. MLE and EBE results were also compared by Monte-Carlo method. Obtained results show that the maximun absolute error of EBE is 0.07, and it is less than the maximum absolute error of MLE which is 0.368.

Key words: semiconductor parallel system; reliability evaluation; empirical Bayes method