Figure 1.
Figure 2.
Figure 3.
Figure 4.
Figure 5.
Figure 6.
7.5 k鈩?/div>
Device
Under
Test
CL *
Device
Under
Test
CL *
* Includes all probe and fixture capacitance.
* Includes all probe and fixture capacitance.
6
MOTOROLA WIRELESS SEMICONDUCTOR
SOLUTIONS 鈥?RF AND IF DEVICE DATA